S2 RANGER

The S2 RANGER performs multi-element analysis from Carbon (C) to Uranium (U) from 100% down to the ppm-level in solids, powders or liquids with little or no sample preparation. Unrivalled analytical performance is ensured by using the highest power in direct excitation geometry.

The award-winning XFlash silicon drift detector technology, now available in its new generation XFlash V5, provides best energy resolution with highest count rates. The new XFlash V5 offers a larger active detector area which results in shorter measurement times and better detection limits. This unique combination of excitation and detection power guaranties good element separation, low detection limits, highest precision and best stability.

 

S8 TIGER

The S8 TIGER spectrometer is the innovative high-end addition to our XRF product family for elemental analysis in various industrial applications, including oil, lubricants, refinery, cement and mining.

Unique features of the S8 TIGER include TouchControl™ and SampleCare™, combining extreme ease of use and robust reliability with superior analytical performance. TouchControl is essential for easy and fail-safe operation. By using an integrated touch screen and dedicated user interface, TouchControl defines a new standard in ease of use for a high-end XRF system. The required training for occasional and inexperienced users is absolutely minimized. The unique SampleCare feature automatically recognizes samples and the integrated contamination shields protect the S8 TIGER against all kinds of contamination, ensuring maximum uptime and availability.

 

S8 DRAGON

The novel S8 DRAGON is the first truly simultaneous X-ray fluorescence (XRF) spectrometer for precise, high-speed elemental analysis for process control in metal production and foundries on the market. It offers high quantitative precision in combination with elemental flexibility for up-to-date production control, covering almost all elements of the periodic table in a single, rapid measurement.

The S8 DRAGON combines in its new design, proven single element channels with the new Multi-element Channel™. With its unique parallel data acquisition in dual mode, the S8 DRAGON offers enhanced data safety for better cost efficiency due to improved process control.

 

D2 PHASER

The new D2 PHASER is the next generation desktop diffractometer for all X-ray powder diffraction applications in Bragg-Brentano geometry. It is equipped with an integrated flat screen monitor, an integrated PC running WINDOWS 8.1, and an ultra-fast SSD drive. The latest version of the DIFFRAC.SUITE software package allows measurement and analysis right out of the box, even CFR 21 Part 11 compliant.

 

D8 DISCOVER

The D8 DISCOVER with DAVINCI design increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, in-plane grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.

The capabilities provided by the D8 DISCOVER, laboratory X-ray diffraction enters new frontiers in the nano-world and materials research so that synchrotron measurement campaigns become obsolete in many cases.

 

D8 FABLINE

By introducing the D8 FABLINE, the analytical flexibility and reliability – known for the D8 DISCOVER family used in research and development – is now transferred to demanding clean room environments. The D8 FABLINE features a robot, handling wafers up to 300 mm diameter as well as it can be equipped with two FOUP ports for routine analytics in quality control. Measurements and data analysis can be fully automated and, if required, Bruker AXS supplies the full service to adjust the analytics to the process requirements. Furthermore, SEC/GEM interface can be suited to user requirements, pattern recognition or bar code reading capabilities can be integrated. D8 FABLINE – an analytical workhorse for semiconductor requirements.

The D8 FABLINE is the only X-ray metrology instrument with various combined applications:

·         High-Resolution X-Ray Diffraction (HRXRD)

·         X-ray Reflectivity (XRR) Grazing Incidence Diffraction (GID)

·         Micro-X-ray Fluorescence (Micro-XRF)

·         Grazing Incidence X-ray Fluorescence (GIXRF)